VNA De-embedding Techniques to High-Speed Signal Integrity Measurement

Menlo Micro Presenting at Microwave Journal Webinar – VNA De-embedding techniques for signal integrity

VNA De-embedding Techniques for Signal Integrity measurement MEMS switch

Thank you for joining the Menlo Micro Webinar hosted by Microwave Journal on August 10th. present “Applying VNA De-embedding Techniques to S-Parameter Measurements of 40Gbps Differential DPDT switch”.

This event showcases the only differential DPDT switch on the market that operates 40Gbps that is also equipped to handle current PCIe GEN 5 and high-speed SerDES applications.

Please contact us in more detail regarding MEMS switch products. Application engineers will consult measurement techniques with MEMS switch for your signal integrity issues.

その他Menlo Micro社製品


  • DPDT
  • DC to 24GHz
  • 25W
  • less than 10uS switching


  • SP4T
  • DC to 26GHz
  • 25W
  • less than 10uS switching


  • 6 channel SPST
  • 1A per channel
  • 25W
  • less than 10uS switching

MEMSスイッチデバイスに関するお問合せは RF MEMS section にアクセスしてMenloMicro製品の詳細を確認してください。